KUMTEK.elektronik sanayi ve ticaret limited şirketi

iletişim


ANA SAYFA

TELEKOM

ELNOX / huber suhner

EĞİTİM KİTLERİ

ÜRETİM
CİHAZLARI
  
elek baskı
  
smt dizgi

   reflow fırınları
  
sıcaklık profili
  
pcb yıkama
  
prototip pcb
  
optik denetim
   dozajlama sistemleri
   özel amaçlı uygulamalar
  
üretim yardımcı malzeme/cihaz

TEST CİHAZLARI
   in-circuit test (ICT)
   flying probe test
   kablo ağacı testi
   boundary scan test

TAMİR EKİPMANI

   bga/csp sökme takma
   lehimleme istasyonları
        Metcal Uyumlu Uçlar (M)
       
Metcal Uyumlu Uçlar (S)

        Metcal Uyumlu Uçlar (P)
  
bga reballing elekleri
  
bga reballing malzemeleri

  
tamir yardımcı malzemeleri

ESD
   esd shielding poşetler
   esd önlükler

   diğer esd ürünleri

Kumtek Elektronik San ve Tic Ltd Şti

Çankaya - Ankara 06550

 




 

                                                                                                            
   
                                                           
YENİ WEB SİTEMİZ

 

IN-CIRCUIT TEST (ICT)

Acculogic Web Sitesi

 

IN-CIRCUIT SCORPION iCT7000

Whether you're choosing from our stand-alone manually loaded tester all the way through to our fully automatic In-line tester system, Acculogic has the system for you!

Acculogic's Scorpion family of In-circuit fixture-based testers were created with one underlining theme in mind: Cost-effective Testing.

To achieve this objective, we designed a range of feature-rich testers offering:

  • Automatic CAD translation tools
  • Advanced automatic program generation software
  • Comprehensive passive component and discrete analog device test
  • Vectorless opens test
  • Unique and convenient Fixture exchange system
  • Customizable Fixture Receiver to protect your fixture investments
We also recognize that, you, our customers - being as diverse as you are - expect in-circuit test equipment to be flexible in addressing your additional value-added requirements.

We weren't sure who would need which features, so we included the following options to ensure you could customize our in-circuit testers to shrink your manufacturing processes and reap the maximum value for your investment.

  • Bode Scan
  • Power-up Test
  • Boundary Scan JTAG) Test
  • Advanced Function Test
  • Flash Device Programming
  • In-System Device Programming

We are also quite sure that none of our customers want to pay for features they won't use. That is why the most flexible, feature-rich in-circuit test platform on the market comes with the most affordable price tags to fit your requirements and budget.

Key Features:

  • Rapid realization of test programs
  • Comprehensive set of ICT test options
  • Graphical program debug tools
  • Reliable measurement electronics
  • Boundary Scan (JTAG) support
  • In-circuit programming support
  • Fast test times
  • Functional testing
  • Graphical CAD-to-Tester processing solution
  • Power-up testing
  • Expandable to meet your future needs
  • SMEMA compatibility

HIGH PERFORMANCE ANALOG MEASUREMENT SYSTEM

The Scorpion family of test equipment all feature an analog measurement system consisting of a Measure and Stimulus instrument (M&S) with flexible bi-directional routing between instruments and receiver pins. Under program control, each of the analog measurement and stimulus instruments are set up and routed to their assigned pins for each test performed. The non-multiplexed architecture of Scorpion ICT series improves test performance and simplifies fixture design and test generation.

The M&S module provides stimulus and measurement facilities for detecting shorts, opens, and incorrect component values on the Unit Under Test (UUT). In-circuit measurement of resistance, capacitance, and inductance identify actual component values. Analog functional testing can also verify power on component parameters such as transistor beta, op amp closed loop gain, diode characteristics, and transfer characteristics.

Patented Vectorless Test

Vectorless test was pioneered in 1990 by ITA/Scorpion, (part of the Acculogic Group). In the last few years, it has become the preferred method to find �opens� faults around large pin count digital devices. This test method has rendered the lengthy process of test pattern development required to inspect complex VLSI parts on traditional In-Circuit testers obsolete. Acculogic's Open Pin detection consists of two complimentary tools for the Scorpion iCT7000-series of testers; CScan� and ChipScan�.

  • CScan� Detects open leads on ICs including BGAs, reverse electrolytic capacitors, connector pins, and decoupling capacitors
  • ChipScan� Detects open leads on ICs including BGAs with heat sinks

BodeScan

BodeScan is a patented, built-in network analyzer for detecting missing or incorrect small value components in complex RF networks

ADVANCED FUNCTION TESTING

Advanced Function Test expands the capabilities of the Scorpion ICT beyond basic manufacturing process test. External commercially available instruments integrate directly with the Scorpion iCT and signal lines are routed to the fixture receiver under software control. Each instrument's graphical user interface (GUI) provides an intuitive representation of the instrument controls and functions. Configuring instruments for a measurement is as simple as setting the dials. Once the parameters for a particular measurement are configured, program steps within the Integrator software environment flow seamlessly. Instrument drivers are based on Interchangeable Virtual Instrument (IVI) protocols thus allowing easy and fast instrument replacement.

Acculogic Integrator� Software

Integrator� software is the comprehensive, easy-to-use graphical test generation and runtime environment for all Scorpion In-Circuit and Flying Probe Test Systems. This software offers Acculogic customers a highly effective user-friendly environment for producing and executing test programs.

Automatic or interactive program generation

Integrator� software accepts CAD data from a variety of board design and layout sources. Integrator uses the CAD data, Bill of Materials (BoM), and netlist to create a high fault coverage test program and generate the complete fixture design and fabrication information. A highly automated process, most elements of the test program can be automatically generated in minutes.

Wide Test Coverage at Impressive Speeds

Evolving test requirements are met through modular expansion of the system with a broad array of innovative, patented test features: CScan, ChipScan, BodeScan or Memory Programming Module (MPM). The result is extremely fast and extensive testing that minimizes false fails.

System versatility

The logical subdivision of the systems into control computer, power supply and measurement/switching unit guarantees ease of integration into any test environment. Its modularity based on the 19�standard rack allows cost-effective incorporation into any production environment.